Determination of impurities in solar grade silicon by inductively coupled plasma sector field mass spectrometry (ICP-SFMS) subsequent to matrix evaporation-Reference-Cited by-同舟云学术

Determination of impurities in solar grade silicon by inductively coupled plasma sector field mass spectrometry (ICP-SFMS) subsequent to matrix evaporation

Published:2014 Issue:1 Volume:6 Page:77-85
ISSN:1759-9660
Container-title:Anal. Methods
language:en
Short-container-title:Anal. Methods

Author:

Balski Matthias,Kipphardt Heinrich,Berger Achim,Meyer Sylke,Panne Ulrich

Publisher

Royal Society of Chemistry (RSC)

Subject

General Engineering,General Chemical Engineering,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2014/AY/C3AY41213J

Reference24 articles.

1. High-Temperature Refining of Metallurgical-Grade Silicon: A Review

2. Control of metal impurities in “dirty” multicrystalline silicon for solar cells

3. Laser ablation inductively coupled plasma mass spectrometry for direct analysis of the spatial distribution of trace elements in metallurgical-grade silicon

4. Determination of trace impurities in silicon and chlorosilanes by inductively coupled plasma atomic emission spectrometry and neutron activation analysis

5. Distribution of iron in multicrystalline silicon ingots

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