Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications-Reference-Cited by-同舟云学术

Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications

Published:2022 Issue:9 Volume:37 Page:1761-1775
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Vanhoof Christine¹^ORCID,Bacon Jeffrey R.²,Fittschen Ursula E. A.³,Vincze Laszlo⁴^ORCID

Affiliation:

1. Flemish Institute for Technological Research (VITO), Boeretang 200, B-2400 Mol, Belgium

2. 59 Arnhall Drive, Westhill, Aberdeenshire, AB32 6TZ, UK

3. Clausthal University of Technology, Institute of Inorganic and Analytical Chemistry, Arnold-Sommerfeld-Strasse 4, D-38678 Clausthal-Zellerfeld, Germany

4. Department of Chemistry, Ghent University, Krijgslaan 281 S12, B-9000 Ghent, Belgium

Abstract

This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2022/JA/D2JA90035A

Reference100 articles.

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