Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications

Author:

Vanhoof Christine1ORCID,Bacon Jeffrey R.2,Fittschen Ursula E. A.3,Vincze Laszlo4ORCID

Affiliation:

1. Flemish Institute for Technological Research (VITO), Boeretang 200, B-2400 Mol, Belgium

2. 59 Arnhall Drive, Westhill, Aberdeenshire, AB32 6TZ, UK

3. Clausthal University of Technology, Institute of Inorganic and Analytical Chemistry, Arnold-Sommerfeld-Strasse 4, D-38678 Clausthal-Zellerfeld, Germany

4. Department of Chemistry, Ghent University, Krijgslaan 281 S12, B-9000 Ghent, Belgium

Abstract

This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

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