Photo-induced force microscopy (PiFM) – principles and implementations-Reference-Cited by-同舟云学术

Photo-induced force microscopy (PiFM) – principles and implementations

Published:2022 Issue:11 Volume:51 Page:4208-4222
ISSN:0306-0012
Container-title:Chemical Society Reviews
language:en
Short-container-title:Chem. Soc. Rev.

Author:

Sifat Abid Anjum¹,Jahng Junghoon²^ORCID,Potma Eric O.¹³^ORCID

Affiliation:

1. Department of Electrical Engineering and Computer Science, University of California, Irvine, CA, USA

2. Hyperspectral Nano-imaging Lab, Korea Research Institute of Standards and Science, Daejeon 34113, South Korea

3. Department of Chemistry, University of California, Irvine, CA, USA

Abstract

In photo-induced force microscopy (PiFM), a sharp atomic tip is illuminated by a tightly focused laser beam and the photo-induced force is measured through the changes in the oscillatory motion of the cantilever.

Funder

National Science Foundation

National Research Foundation of Korea

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2022/CS/D2CS00052K

Reference50 articles.

1. Image force microscopy of molecular resonance: A microscope principle

2. Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution

3. Direct Measurement of Photoinduced Force for Nanoscale Infrared Spectroscopy and Chemical-Sensitive Imaging

4. Generalized Heterodyne Configurations for Photoinduced Force Microscopy

5. Probing Mid-Infrared Phonon Polaritons in the Aqueous Phase

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