High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires-Reference-Cited by-同舟云学术

High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires

Published:2016 Issue:11 Volume:16 Page:2126-2134
ISSN:1473-0197
Container-title:Lab on a Chip
language:en
Short-container-title:Lab Chip

Author:

Akin Cevat¹²³⁴,Feldman Leonard C.⁵²³⁴,Durand Corentin⁶⁷⁸⁴,Hus Saban M.⁶⁷⁸⁴,Li An-Ping⁶⁷⁸⁴,Hui Ho Yee⁹¹⁰¹¹⁴,Filler Michael A.⁹¹⁰¹¹⁴,Yi Jingang¹²³⁴,Shan Jerry W.¹²³⁴⁵

Affiliation:

1. Department of Mechanical and Aerospace Engineering

2. Rutgers University

3. Piscataway

4. USA

5. Institute of Advanced Materials, Devices, and Nanotechnology

6. Center for Nanophase Materials Sciences

7. Oak Ridge National Laboratory

8. Oak Ridge

9. School of Chemical & Biomolecular Engineering

10. Georgia Institute of Technology

11. Atlanta

Abstract

Existing nanowire electrical characterization tools not only are expensive and require sophisticated facilities, but are far too slow to enable statistical characterization of highly variable samples.

Funder

Defense Threat Reduction Agency

Division of Chemical, Bioengineering, Environmental, and Transport Systems

Basic Energy Sciences

Publisher

Royal Society of Chemistry (RSC)

Subject

Biomedical Engineering,General Chemistry,Biochemistry,Bioengineering

Link

http://pubs.rsc.org/en/content/articlepdf/2016/LC/C6LC00217J

Reference40 articles.

1. Nanoelectronics from the bottom up