2019 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications

Author:

Vanhoof Christine123,Bacon Jeffrey R.45,Ellis Andrew T.65,Fittschen Ursula E. A.78910,Vincze Laszlo1112133

Affiliation:

1. Flemish Institute for Technological Research (VITO)

2. B-2400 Mol

3. Belgium

4. Aberdeenshire

5. UK

6. Abingdon

7. Clausthal University of Technology

8. Institute of Inorganic and Analytical Chemistry

9. D-38678 Clausthal-Zellerfeld

10. Germany

11. Ghent University

12. Department of Chemistry

13. B-9000 Ghent

Abstract

This 2019 review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

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