Stable field-emission from a CeB6 nanoneedle point electron source-Reference-Cited by-同舟云学术

Stable field-emission from a CeB6 nanoneedle point electron source

Published:2021 Issue:40 Volume:13 Page:17156-17161
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Tang Shuai¹,Tang Jie¹²^ORCID,Wu Yimeng¹²,Chen You-Hu¹,Uzuhashi Jun¹,Ohkubo Tadakatsu¹,Qin Lu-Chang³^ORCID

Affiliation:

1. National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan

2. Graduate School of Pure and Applied Science, University of Tsukuba, Tsukuba, Ibaraki 305-8857, Japan

3. Department of Physics and Astronomy, University of North Carolina at Chapel Hill, Chapel Hill, NC 27599-3255, USA

Abstract

A single CeB6 nanoneedle structure has been fabricated using a focused ion beam (FIB) and it shows an excellent field emission current stability as well as a single emission spot.

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2021/NR/D1NR04907K

Reference39 articles.

1. Electron emission in intense electric fields

2. Elektronenmikroskopische Beobachtungen von Feldkathoden

3. Electron Gun Using a Field Emission Source

4. Novel cold cathode materials and applications

5. Comparison of parameters for Schottky and cold field emission sources

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