NanoSIMS measurements of trace elements at the micron scale interface between zircon and silicate glass-Reference-Cited by-同舟云学术

NanoSIMS measurements of trace elements at the micron scale interface between zircon and silicate glass

Published:2016 Issue:12 Volume:31 Page:2399-2409
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Hao Jia-Long¹²³⁴⁵,Yang Wei¹²³⁴⁵,Luo Yan⁶⁷⁸⁹,Hu Sen¹²³⁴⁵,Yin Qing-Zhu¹⁰¹¹¹²¹³,Lin Yang-Ting¹²³⁴⁵

Affiliation:

1. Key Laboratory of Earth and Planetary Physics

2. Institute of Geology and Geophysics

3. Chinese Academy of Sciences

4. Beijing 100029

5. China

6. Department of Earth and Atmospheric Sciences

7. University of Alberta

8. Edmonton

9. Canada

10. Department of Earth and Planetary Sciences

11. University of California at Davis

12. Davis

13. USA

Abstract

We present a new method to measure trace element variation at the micron scale interface between zircon and melt. Two analytical modes (“grain mode” and “image mode”) were applied and shown as below.

Funder

National Natural Science Foundation of China

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2016/JA/C6JA00279J

Reference38 articles.

1. Igneous zircon: trace element composition as an indicator of source rock type

2. Magmatic and Crustal Differentiation History of Granitic Rocks from Hf-O Isotopes in Zircon

3. Historical Development of Zircon Geochronology

4. Rare-earth elements in synthetic zircon: Part 2. A single-crystal X-ray study of xenotime substitution

5. Rare Earth Element Behavior in Zircon-Melt Systems

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