Core–shell InGaN/GaN nanowire light emitting diodes analyzed by electron beam induced current microscopy and cathodoluminescence mapping-Reference-Cited by-同舟云学术

Core–shell InGaN/GaN nanowire light emitting diodes analyzed by electron beam induced current microscopy and cathodoluminescence mapping

Published:2015 Issue:27 Volume:7 Page:11692-11701
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Tchernycheva M.¹²³⁴,Neplokh V.¹²³⁴,Zhang H.¹²³⁴,Lavenus P.¹²³⁴,Rigutti L.¹²³⁴⁵,Bayle F.¹²³⁴,Julien F. H.¹²³⁴,Babichev A.¹²³⁴⁶,Jacopin G.⁷⁸,Largeau L.⁹¹⁰¹¹,Ciechonski R.¹²¹³¹⁴,Vescovi G.¹²¹³¹⁴,Kryliouk O.¹⁵¹⁶

Affiliation:

1. Institut d'Electronique Fondamentale

2. UMR 8622 CNRS

3. University Paris Sud

4. 91405 Orsay cedex, France

5. Groupe de Physique des Matériaux

6. ITMO University

7. ICMP LOEQ Ecole Polytechnique Fédérale de Lausanne

8. 1015 Lausanne, Switzerland

9. LPN-CNRS

10. Route de Nozay

11. 91460 Marcoussis, France

12. GLO AB

13. Ideon Science Park

14. S-223 70 Lund, Sweden

15. GLO-USA

16. Sunnyvale, USA

Abstract

SEM image and electron beam induced current map of InGaN/GaN nanowire core–shell led in cross-sectional and top view configurations.

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2015/NR/C5NR00623F

Reference39 articles.

1. Charge collection scanning electron microscopy

2. Minority-carrier diffusion length in a GaN-based light-emitting diode

3. Analysis of V defects in GaN-based light emitting diodes by scanning transmission electron microscopy and electron beam induced current

4. Optical degradation of InGaN/AlGaN light‐emitting diode on sapphire substrate grown by metalorganic chemical vapor deposition

5. Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices

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