Grain and stoichiometry engineering for ultra-sensitive perovskite X-ray detectors-Reference-Cited by-同舟云学术

Grain and stoichiometry engineering for ultra-sensitive perovskite X-ray detectors

Published:2021 Issue:45 Volume:9 Page:25603-25610
ISSN:2050-7488
Container-title:Journal of Materials Chemistry A
language:en
Short-container-title:J. Mater. Chem. A

Author:

Xiao Yingrui¹,Jia Shanshan¹,Bu Nuo¹,Li Nan¹,Liu Yucheng¹,Liu Ming²,Yang Zhou¹^ORCID,Liu Shengzhong (Frank)¹³^ORCID

Affiliation:

1. Key Laboratory of Applied Surface and Colloid Chemistry, Ministry of Education, Shaanxi Key Laboratory for Advanced Energy Devices, Shaanxi Engineering Lab for Advanced Energy Technology, Institute for Advanced Energy Materials, School of Materials Science and Engineering, Shaanxi Normal University, Xi'an 710119, China

2. School of Microelectronics, State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China

3. Dalian National Laboratory for Clean Energy, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian, 116023, China

Abstract

Both grain engineering and stoichiometry engineering, by controlling the grain growth, material module and powder composition, are essential for hot-pressed wafers to achieve better carrier transportation and high X-ray sensitivity.

Funder

National Natural Science Foundation of China

National Key Research and Development Program of China

Shaanxi Normal University

Higher Education Discipline Innovation Project

Chinese Academy of Sciences

Program for Changjiang Scholars and Innovative Research Team in University

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science,Renewable Energy, Sustainability and the Environment,General Chemistry

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