Identifying and mapping chemical bonding within phenolic resin using secondary electron hyperspectral imaging-Reference-Cited by-同舟云学术

Identifying and mapping chemical bonding within phenolic resin using secondary electron hyperspectral imaging

Published:2021 Issue:2 Volume:12 Page:177-182
ISSN:1759-9954
Container-title:Polymer Chemistry
language:en
Short-container-title:Polym. Chem.

Author:

Farr Nicholas T. H.¹²³⁴⁵^ORCID,Hamad Sameer F.¹²³⁴⁵,Gray Euan¹²³⁴⁵,Magazzeni Christopher M.⁶⁷⁸⁵,Longman Fodio¹²³⁴⁵,Armstrong David E. J.⁶⁷⁸⁵,Foreman Joel P.¹²³⁴⁵,Claeyssens Frederik¹²³⁴⁵,Green Nicola H.¹²³⁴⁵^ORCID,Rodenburg Cornelia¹²³⁴⁵^ORCID

Affiliation:

1. Department of Materials Science and Engineering

2. Sir Robert Hadfield Building

3. Mappin Street

4. University of Sheffield

5. UK

6. Department of Materials

7. University of Oxford

8. Oxford

Abstract

“Secondary electron hyperspectral imaging (SEHI) is an innovative SEM-based analysis tool allowing spatially-resolved chemical analysis beyond elemental composition”.

Funder

Engineering and Physical Sciences Research Council

Publisher

Royal Society of Chemistry (RSC)

Subject

Organic Chemistry,Polymers and Plastics,Biochemistry,Bioengineering

Link

http://pubs.rsc.org/en/content/articlepdf/2021/PY/D0PY01220C

Reference27 articles.

1. Phenolic resins—100years of progress and their future

2. Research status, industrial application demand and prospects of phenolic resin

3. Synthesis of poly(siloxane/double-decker silsesquioxane) via dehydrocarbonative condensation reaction and its functionalization