Surface hopping investigation of benzophenone excited state dynamics
Author:
Affiliation:
1. Università di Pisa
2. Dipartimento di Farmacia
3. 56126 Pisa
4. Italy
5. Dipartimento di Chimica e Chimica Industriale
6. 56124 Pisa
Abstract
A mechanism of S1 decay in benzophenone: S1 → T1 is the main pathway, although transitions to T2 and higher triplets play a relevant role.
Publisher
Royal Society of Chemistry (RSC)
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://pubs.rsc.org/en/content/articlepdf/2016/CP/C6CP00328A
Reference43 articles.
1. V. Balzani , P.Ceroni and A.Juris, Photochemistry and Photophysics, Wiley-VCH, 2014
2. R. P. Wayne , Principles and applications of photochemistry, Oxford University Press, 1988
3. Benzophenone Photosensitized DNA Damage
4. Resolving the Benzophenone DNA-Photosensitization Mechanism at QM/MM Level
Cited by 30 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Ultrafast Intersystem Crossing in Benzanthrone: Effect of Hydrogen Bonding and Viscosity;The Journal of Physical Chemistry A;2024-08-12
2. Spin-Vibronic Intersystem Crossing and Molecular Packing Effects in Heavy Atom Free Organic Phosphor;Journal of Chemical Theory and Computation;2024-01-25
3. Singlet fission initiating organic photosensitizations;Scientific Reports;2024-01-08
4. Intersystem crossing in a dibenzofuran-based room temperature phosphorescent luminophore investigated by non-adiabatic dynamics;Physical Chemistry Chemical Physics;2024
5. Theoretical study of the absorption and emission spectrum and non‐adiabatic excited state dynamics of gas‐phase xanthone;Journal of the Chinese Chemical Society;2023-01
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3