Elemental and molecular speciation of lead particles by dynamic C-60 secondary ion mass spectrometry
Author:
Publisher
Royal Society of Chemistry (RSC)
Subject
General Engineering,General Chemical Engineering,Analytical Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2012/AY/C2AY25676B
Reference18 articles.
1. Isotopic source signatures for atmospheric lead: the Southern Hemisphere
2. Isotopic source signatures for atmospheric lead: the Northern Hemisphere
3. Elemental speciation: where do we come from? where do we go?
4. Capabilities of static TOF-SIMS in the differentiation of first-row transition metal oxides
5. Speciation analysis of oxides with static secondary ion mass spectrometry
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2. Molecular speciation analysis of oxidized metal surfaces by TOF SIMS;Applied Surface Science;2022-03
3. Characterization of hydroxyapatite deposition on biomimetic polyphosphazenes by time-of-flight secondary ion mass spectrometry (ToF-SIMS);RSC Adv.;2014
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