Microscopy aided detection of the self-intercalation mechanism and <i>in situ</i> electronic properties in chromium selenide-Reference-Cited by-同舟云学术

Microscopy aided detection of the self-intercalation mechanism and in situ electronic properties in chromium selenide

Published:2024 Issue:16 Volume:16 Page:8028-8035
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Zhang Jinding¹,Xiao Yulong¹,Li Kaihui¹,Chen Ying¹,Liu Songlong²,Luo Wenjie¹,Liu Xueying¹,Liu Shiying¹,Wang Yiliu²,Li Si-Yu¹³^ORCID,Pan Anlian¹⁴^ORCID

Affiliation:

1. Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, Hunan Institute of Optoelectronic Integration and College of Materials Science and Engineering, Hunan University, Changsha 410082, People's Republic of China

2. School of Physics and Electronics, Hunan University, Changsha 410082, People's Republic of China

3. Greater Bay Area Institute for Innovation, Hunan University, Guangzhou 511300, People's Republic of China

4. School of Physics and Electronics, Hunan Normal University, Changsha 410081, People's Republic of China

Abstract

Atomic microscopy detection directly reveals the coexistence of multiple stoichiometric ratios in self-intercalated chromium selenide and clearly shows the intercalation mechanism of Cr atoms according to the periodicity of the cross section and surface.

Funder

National Basic Research Program of China

National Natural Science Foundation of China

Hunan Provincial Science and Technology Department

Chinese Academy of Sciences

Natural Science Foundation of Guangdong Province

Publisher

Royal Society of Chemistry (RSC)

Link

http://pubs.rsc.org/en/content/articlepdf/2024/NR/D4NR00048J

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