Few layered MoS2lithography with an AFM tip: description of the technique and nanospectroscopy investigations-Reference-Cited by-同舟云学术

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Few layered MoS2lithography with an AFM tip: description of the technique and nanospectroscopy investigations

Published:2015 Issue:26 Volume:7 Page:11453-11459
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Donarelli M.,Perrozzi F.,Bisti F.,Paparella F.,Feyer V.,Ponzoni A.,Gonchigsuren M.,Ottaviano L.

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2015/NR/C5NR02337H

Reference33 articles.

1. Two-dimensional atomic crystals

2. Silicon nanowire circuits fabricated by AFM oxidation nanolithography

3. Atomic force microscope tip-induced local oxidation of silicon: kinetics, mechanism, and nanofabrication

4. Local oxidation of silicon surfaces by dynamic force microscopy: Nanofabrication and water bridge formation

5. Tip-induced local anodic oxidation on the nativeSiO2layer of Si(111) using an atomic force microscope

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1. Exploring the Surface Oxidation and Environmental Instability of 2H‐/1T’‐MoTe₂ Using Field Emission‐Based Scanning Probe Lithography;Advanced Materials;2023-12

2. Phase Engineering of Two‐Dimensional Transition Metal Dichalcogenides;Small Science;2023-11-27

3. Electric field-assisted patterning of few-layer MoTe2 by scanning probe lithography;Journal of the Korean Physical Society;2022-12-07

4. MoS2 based nanocomposites: An excellent material for energy and environmental applications;Journal of Environmental Chemical Engineering;2021-10

5. Identification of the anti-triangular etched MoS2 with comparative activity with commercial Pt for hydrogen evolution reaction;International Journal of Hydrogen Energy;2020-11

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