Degradation of quantum dot light emitting diodes, the case under a low driving level-Reference-Cited by-同舟云学术

Degradation of quantum dot light emitting diodes, the case under a low driving level

Published:2020 Issue:6 Volume:8 Page:2014-2018
ISSN:2050-7526
Container-title:Journal of Materials Chemistry C
language:en
Short-container-title:J. Mater. Chem. C

Author:

Xue Xulan¹²³⁴,Dong Jiayi⁵⁶⁷⁸,Wang Shuangpeng⁵⁶⁷⁸,Zhang Hanzhuang¹²³⁴,Zhang Han¹²³⁴,Zhao Jialong⁹¹⁰¹¹¹²⁴^ORCID,Ji Wenyu¹²³⁴^ORCID

Affiliation:

1. College of Physics

2. Jilin University

3. Changchun 130012

4. China

5. Institute of Applied Physics and Materials Engineering

6. University of Macau

7. Taipa 999078

8. Macau SAR

9. Center on Nanoenergy Research

10. School of Physical Science and Technology

11. Guangxi University

12. Nanning 530004

Abstract

The case of degradation in red QLEDs driven by a low current density of 7.5 mA cm⁻² is systematically investigated. It is demonstrated that the exceeding electron accumulation and leakage are responsible for the degradation of red QLED devices.

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2020/TC/C9TC04107A

Reference21 articles.

1. High color purity ZnSe/ZnS core/shell quantum dot based blue light emitting diodes with an inverted device structure

2. Single-Dot Spectroscopy of Zinc-Blende CdSe/CdS Core/Shell Nanocrystals: Nonblinking and Correlation with Ensemble Measurements

3. Solution-processed, high-performance light-emitting diodes based on quantum dots

4. Tandem colloidal quantum dot solar cells employing a graded recombination layer

5. A colloidal quantum dot spectrometer

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