What's underneath? A non-destructive depth profile of painted stratigraphies by synchrotron grazing incidence X-ray diffraction-Reference-Cited by-同舟云学术

What's underneath? A non-destructive depth profile of painted stratigraphies by synchrotron grazing incidence X-ray diffraction

Published:2018 Issue:18 Volume:143 Page:4290-4297
ISSN:0003-2654
Container-title:The Analyst
language:en
Short-container-title:Analyst

Author:

Possenti Elena¹²³⁴⁵^ORCID,Colombo Chiara⁵⁶⁷⁴^ORCID,Conti Claudia⁵⁶⁷⁴^ORCID,Gigli Lara⁸⁹⁴,Merlini Marco¹²³⁴^ORCID,Plaisier Jasper Rikkert⁸⁹⁴^ORCID,Realini Marco⁵⁶⁷⁴^ORCID,Gatta G. Diego¹²³⁴^ORCID

Affiliation:

1. Dipartimento di Scienze della Terra

2. Università degli Studi di Milano

3. 20133 Milan

4. Italy

5. Istituto per la Conservazione e la Valorizzazione dei Beni Culturali (ICVBC)

6. Consiglio Nazionale delle Ricerche (CNR)

7. 20125 Milan

8. Elettra - Sincrotrone Trieste S.c.P.A.

9. Trieste

Abstract

Underlying layers of polychrome stratigraphies revealed using a non-destructive approach by synchrotron radiation grazing incidence X-ray diffraction.

Publisher

Royal Society of Chemistry (RSC)

Subject

Electrochemistry,Spectroscopy,Environmental Chemistry,Biochemistry,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2018/AN/C8AN00901E

Reference29 articles.

1. Subsurface analysis of painted sculptures and plasters using micrometre‐scale spatially offset Raman spectroscopy (micro‐SORS)

2. Subsurface Raman Analysis of Thin Painted Layers

3. Comparison of key modalities of micro-scale spatially offset Raman spectroscopy

4. Contrasting confocal with defocusing microscale spatially offset Raman spectroscopy

5. Determination of thickness of thin turbid painted over-layers using micro-scale spatially offset Raman spectroscopy

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