Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films-Reference-Cited by-同舟云学术

Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films

Published:2020 Issue:8 Volume:35 Page:1664-1670
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Wählisch André¹²³^ORCID,Streeck Cornelia¹²³^ORCID,Hönicke Philipp¹²³^ORCID,Beckhoff Burkhard¹²³

Affiliation:

1. Physikalisch-Technische Bundesanstalt

2. 10587 Berlin

3. Germany

Abstract

Reference-free X-ray fluorescence analysis of multilayered, alloyed thin films in the μm regime with significant secondary fluorescence contributions.

Funder

European Association of National Metrology Institutes

European Metrology Programme for Innovation and Research

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2020/JA/D0JA00171F

Reference45 articles.

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3. Flexible suspended gate organic thin-film transistors for ultra-sensitive pressure detection

4. Thin-film electrode based on zeolitic imidazolate frameworks (ZIF-8 and ZIF-67) with ultra-stable performance as a lithium-ion battery anode

5. Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films

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