Observation of diffuse scattering in scanning helium microscopy-Reference-Cited by-同舟云学术

Observation of diffuse scattering in scanning helium microscopy

Published:2022 Issue:43 Volume:24 Page:26539-26546
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Lambrick S. M.¹^ORCID,Bergin M.²^ORCID,Ward D. J.¹^ORCID,Barr M.²,Fahy A.²,Myles T.²,Radić A.¹^ORCID,Dastoor P. C.²,Ellis J.¹,Jardine A. P.¹

Affiliation:

1. Department of Physics, Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge, CB3 0HE, UK

2. Centre for Organic Electronics, University of Newcastle, Physics Building, Callaghan, NSW 2308, Australia

Abstract

By studying well defined geometries (microspheres) in scanning helium microscopy (SHeM) the default scattering distribution for technological surfaces in SHeM is found to be diffuse and approximately cosine.

Funder

Australian National Fabrication Facility

Engineering and Physical Sciences Research Council

MathWorks

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2022/CP/D2CP01951E

Reference41 articles.

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