Detection of defect populations in superhard semiconductor boron subphosphide B12P2 through X-ray absorption spectroscopy-Reference-Cited by-同舟云学术

Detection of defect populations in superhard semiconductor boron subphosphide B12P2 through X-ray absorption spectroscopy

Published:2017 Issue:12 Volume:5 Page:5737-5749
ISSN:2050-7488
Container-title:Journal of Materials Chemistry A
language:en
Short-container-title:J. Mater. Chem. A

Author:

Huber S. P.¹²³⁴⁵^ORCID,Gullikson E.⁶²³⁴,Meyer-Ilse J.⁶²³⁴,Frye C. D.⁷⁸⁹⁴,Edgar J. H.⁷⁸⁹⁴,van de Kruijs R. W. E.⁵¹⁰¹¹¹²¹³,Bijkerk F.⁵¹⁰¹¹¹²¹³,Prendergast D.¹²³⁴

Affiliation:

1. Molecular Foundry

2. Lawrence Berkeley National Laboratory

3. Berkeley

4. USA

5. Industrial Focus Group XUV Optics

6. Center for X-Ray Optics

7. Department of Chemical Engineering

8. Kansas State University

9. Manhattan

10. MESA+ Research Institute for Nanotechnology

11. University of Twente

12. Enschede

13. The Netherlands

Abstract

Defect populations in B₁₂P₂ samples are analyzed through spectroscopic fingerprinting, by simulating the X-ray spectroscopic signatures of crystallographic point defects from first-principles within the density functional theory framework.

Funder

Basic Energy Sciences

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science,Renewable Energy, Sustainability and the Environment,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2017/TA/C6TA10935G

Reference30 articles.

1. Self-healing in B12P2 through Mediated Defect Recombination

2. Boron Suboxide and Boron Subphosphide Crystals: Hard Ceramics That Shear without Brittle Failure

3. Boron Phosphide on Silicon for Radiation Detectors