Insight into the inclusion of heteroatom impurities in silicon structures-Reference-Cited by-同舟云学术

Insight into the inclusion of heteroatom impurities in silicon structures

Published:2022 Issue:25 Volume:24 Page:15588-15602
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Maji Rita¹^ORCID,Luppi Eleonora²^ORCID,Degoli Elena³⁴⁵^ORCID,Contreras-García Julia²^ORCID

Affiliation:

1. Dipartimento di Scienze e Metodi dell'Ingegneria, Università di Modena e Reggio Emilia, Via Amendola 2 Padiglione Tamburini, I-42122 Reggio Emilia, Italy

2. Laboratoire de Chimie Théorique, Sorbonne Université and CNRS, F-75005 Paris, France

3. Dipartimento di Scienze e Metodi dell'Ingegneria, Università di Modena e Reggio Emilia and Centro Interdipartimentale En&Tech, Via Amendola 2 Padiglione Morselli, I-42122 Reggio Emilia, Italy

4. Centro S3, Istituto Nanoscienze-Consiglio Nazionale delle Ricerche (CNR-NANO), Via Campi 213/A, 41125 Modena, Italy

5. Centro Interdipartimentale di Ricerca e per i Servizi nel settore della produzione, stoccaggio ed utilizzo dell'Idrogeno H2–MO.RE., Via Università 4, 41121 Modena, Italy

Abstract

A comprehensive understanding of the structural condition and impurity agglomerates in poly-Si structures can be obtained through the topological analysis of ELF for the characterization of chemical changes induced by defects.

Funder

Università Degli Studi di Modena e Reggio Emila

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2022/CP/D2CP01493A

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