Ultra-sharp and surfactant-free silver nanowire for scanning tunneling microscopy and tip-enhanced Raman spectroscopy-Reference-Cited by-同舟云学术

Ultra-sharp and surfactant-free silver nanowire for scanning tunneling microscopy and tip-enhanced Raman spectroscopy

Published:2019 Issue:16 Volume:11 Page:7790-7797
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Liu Qiushi¹²³⁴⁵^ORCID,Kim Sanggon⁶²³⁴⁵^ORCID,Ma Xuezhi¹²³⁴⁵^ORCID,Yu Ning⁶²³⁴⁵^ORCID,Zhu Yangzhi⁶²³⁴⁵^ORCID,Deng Siyu¹²³⁴⁵,Yan Ruoxue⁶²³⁴⁵^ORCID,Zhao Huijuan⁷⁸⁹⁵^ORCID,Liu Ming¹²³⁴⁵

Affiliation:

1. Department of Electrical and Computer Engineering

2. Bourns College of Engineering

3. University of California-Riverside

4. Riverside

5. USA

6. Department of Chemical and Environmental Engineering

7. Department of Mechanical Engineering

8. Clemson University

9. Clemson

Abstract

Sharp-tip silver nanowires with PVP coating removed can be used for STM-TERS measurement.

Funder

Division of Chemistry

Division of Materials Research

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2019/NR/C8NR08983C

Reference37 articles.

1. Metallized tip amplification of near-field Raman scattering

2. Nanoscale Probing of Adsorbed Species by Tip-Enhanced Raman Spectroscopy

3. NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH POINTED PROBES

4. Tip-enhanced Raman spectroscopy of carbon nanotubes

5. Locally enhanced Raman spectroscopy with an atomic force microscope

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