Nanoscale heat transport analysis by scanning thermal microscopy: from calibration to high-resolution measurements-Reference-Cited by-同舟云学术

Nanoscale heat transport analysis by scanning thermal microscopy: from calibration to high-resolution measurements

Published:2022 Issue:15 Volume:4 Page:3194-3211
ISSN:2516-0230
Container-title:Nanoscale Advances
language:en
Short-container-title:Nanoscale Adv.

Author:

Vera-Londono Liliana¹^ORCID,Ruiz-Clavijo Alejandra¹^ORCID,Pérez-Taborda Jaime Andrés¹²^ORCID,Martín-González Marisol¹^ORCID

Affiliation:

1. Instituto de Micro y Nanotecnología, IMN-CNM, CSIC (CEI UAM+CSIC) Isaac Newton, 8, Tres Cantos, E-28760, Madrid, Spain

2. Universidad Nacional de Colombia Sede De La Paz, Escuela de Pregrados-Dirección Académica – Vicerrectoría, Grupo de Nanoestructuras y Física Aplicada (NANOUPAR), Km 9 vía Valledupar La Paz, La Paz 202010, Colombia

Abstract

Scanning thermal microscopy is a powerful technique to study thermal properties at the nanoscale. Pd/Si3N4 thermo-resistive probes has largely improved the spatial resolution compared to Wollaston probes, facilitating the analysis of nanoscale thermal heterogeneities.

Funder

Ministerio de Ciencia e Innovación

Publisher

Royal Society of Chemistry (RSC)

Subject

General Engineering,General Materials Science,General Chemistry,Atomic and Molecular Physics, and Optics,Bioengineering

Link

http://pubs.rsc.org/en/content/articlepdf/2022/NA/D2NA00287F

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