Thickness-dependent phase boundary in Sm-doped BiFeO3 piezoelectric thin films on Pt/Ti/SiO2/Si substrates-Reference-Cited by-同舟云学术

Thickness-dependent phase boundary in Sm-doped BiFeO3 piezoelectric thin films on Pt/Ti/SiO2/Si substrates

Published:2015 Issue:30 Volume:17 Page:19759-19765
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Sun Wei¹²³⁴⁵,Li Jing-Feng¹²³⁴⁵,Zhu Fangyuan¹²³⁴⁵,Yu Qi¹²³⁴⁵,Cheng Li-Qian¹²³⁴⁵,Zhou Zhen¹²³⁴⁵

Affiliation:

1. State Key Laboratory of New Ceramics and Fine Processing

2. School of Materials Science and Engineering

3. Tsinghua University

4. 100084 Beijing

5. P. R. China

Abstract

Structure analysis and piezoelectricity characterization revealed a thickness-dependent phase diagram of Bi_1−xSm_xFeO₃ films on Pt(111)/Ti/SiO₂/Si substrates.

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2015/CP/C5CP03080C

Reference43 articles.

1. Epitaxial BiFeO 3 Multiferroic Thin Film Heterostructures

2. Physics and Applications of Bismuth Ferrite

3. A Strain-Driven Morphotropic Phase Boundary in BiFeO 3

4. Deterministic switching of ferromagnetism at room temperature using an electric field

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