A guide to nanoscale IR spectroscopy: resonance enhanced transduction in contact and tapping mode AFM-IR-Reference-Cited by-同舟云学术

A guide to nanoscale IR spectroscopy: resonance enhanced transduction in contact and tapping mode AFM-IR

Published:2022 Issue:13 Volume:51 Page:5248-5267
ISSN:0306-0012
Container-title:Chemical Society Reviews
language:en
Short-container-title:Chem. Soc. Rev.

Author:

Schwartz Jeffrey J.¹²^ORCID,Jakob Devon S.²³^ORCID,Centrone Andrea²^ORCID

Affiliation:

1. Laboratory for Physical Sciences, College Park, MD 20740, USA

2. Nanoscale Device Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, 20899, USA

3. Institute for Soft Matter Synthesis and Metrology, Georgetown University, 3700 O St., NW Washington D.C., 20057, USA

Abstract

By combining capabilities of atomic force microscopy (AFM) with infrared (IR) spectroscopy, AFM-IR resolves nanoscale compositional details. This tutorial reviews technical breakthroughs, working principles, best practices, and future prospects of AFM-IR.

Funder

Georgetown University

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2022/CS/D2CS00095D

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