Local structure of semicrystalline P3HT films probed by nanofocused coherent X-rays-Reference-Cited by-同舟云学术

Local structure of semicrystalline P3HT films probed by nanofocused coherent X-rays

Published:2015 Issue:11 Volume:17 Page:7404-7410
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Kurta Ruslan P.¹²³⁴⁵,Grodd Linda⁶⁷⁸³,Mikayelyan Eduard⁶⁷⁸³,Gorobtsov Oleg Y.¹²³⁹¹⁰,Zaluzhnyy Ivan A.¹²³¹¹¹²,Fratoddi Ilaria¹³¹⁴¹⁵¹⁶,Venditti Iole¹⁷¹⁴¹⁵¹⁶^ORCID,Russo Maria Vittoria¹⁷¹⁴¹⁵¹⁶,Sprung Michael¹²³,Vartanyants Ivan A.¹²³¹¹¹²,Grigorian Souren⁶⁷⁸³

Affiliation:

1. Deutsches Elektronen-Synchrotron DESY

2. D-22607 Hamburg

3. Germany

4. European XFEL GmbH

5. D-22761 Hamburg

6. Department of Physics

7. University of Siegen

8. D-57072 Siegen

9. National Research Center “Kurchatov Institute”

10. 123182 Moscow

11. National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)

12. 115409 Moscow

13. Department of Chemistry and Center for Nanotechnology for Engineering (CNIS)

14. University of Rome Sapienza

15. I-00185 Rome

16. Italy

17. Department of Chemistry

Abstract

Spatially resolved x-ray study of semicrystalline P3HT films reveals nanoscale inhomogeneity of the conjugated network, as well as structural variations induced by Au nanoparticles.

Funder

Bundesministerium für Bildung und Forschung

Helmholtz Association

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2015/CP/C5CP00426H

Reference53 articles.

1. Dependence of Regioregular Poly(3-hexylthiophene) Film Morphology and Field-Effect Mobility on Molecular Weight

2. Influence of processing conditions on the stability of poly(3-hexylthiophene)-based field-effect transistors