Formation of an interphase layer during deposition of cobalt onto tetraphenylporphyrin: a hard X-ray photoelectron spectroscopy (HAXPES) study-Reference-Cited by-同舟云学术

Formation of an interphase layer during deposition of cobalt onto tetraphenylporphyrin: a hard X-ray photoelectron spectroscopy (HAXPES) study

Published:2016 Issue:44 Volume:18 Page:30643-30651
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Chen Min¹²³⁴,Zhou Han¹²³⁴,Klein Benedikt P.¹²³⁴,Zugermeier Malte¹²³⁴,Krug Claudio K.¹²³⁴,Drescher Hans-Jörg¹²³⁴,Gorgoi Mihaela⁵⁶⁴,Schmid Martin¹²³⁴,Gottfried J. Michael¹²³⁴

Affiliation:

1. Fachbereich Chemie

2. Philipps-Universität Marburg

3. 35032 Marburg

4. Germany

5. Helmholtz Zentrum Berlin für Materialien und Energie GmbH

6. 12489 Berlin

Abstract

Chemical depth profiling of a metal/porphyrin interface with Hard X-ray Photoelectron Spectroscopy (HAXPES) reveals the formation of a 1.6 nm thick interphase layer.

Funder

Deutsche Forschungsgemeinschaft

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2016/CP/C6CP05894A

Reference62 articles.

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