Characterization of doped strontium sulfide thin films by secondary ion mass spectrometry, Rutherford backscattering spectrometry and X-ray fluorescence spectrometry-Reference-Cited by-同舟云学术

Characterization of doped strontium sulfide thin films by secondary ion mass spectrometry, Rutherford backscattering spectrometry and X-ray fluorescence spectrometry

Published:1994 Issue:8 Volume:119 Page:1725-1729
ISSN:0003-2654
Container-title:The Analyst
language:en
Short-container-title:Analyst

Author:

Lehto Sari,Soininen Pekka,Niinistö Lauri,Likonen Jari,Lappalainen Reijo

Publisher

Royal Society of Chemistry (RSC)

Subject

Electrochemistry,Spectroscopy,Environmental Chemistry,Biochemistry,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/1994/AN/AN9941901725

Reference15 articles.

1. P. Soininen , E.Nykänen, M.Leskelä, and L.Nimistö, in Eurodisplay '93, The Proceedings of the 13th International Display Research Conference, Strasbourg, 1993, pp. 511–514.

2. Applications of rare earths in full-colour EL displays

3. Determination of lead concentration and film thickness in electroluminescent calcium sulfide thin films by X-ray fluorescence

4. Characterization of thin-film electroluminescent structures by SIMS and other analytical techniques

5. Effects of Annealing on ZnS:Tb, F Electroluminescent Thin Films Prepared by rf Magnetron Sputtering

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