An on-line electrodialyzer-ICP-MS analytical system for direct determination of trace metal impurities in KOH
Author:
Publisher
Royal Society of Chemistry (RSC)
Subject
Spectroscopy,Analytical Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2008/JA/B712296A
Reference18 articles.
1. Effects of small amount of impurities on etching of silicon in aqueous potassium hydroxide solutions
2. Characterization of anisotropic wet etching properties of single crystal silicon: Effects of ppb-level of Cu and Pb in KOH solution
3. Direct determination of trace elements in high purity materials by stripping voltammetry
4. Rapid Determination of Trace Impurities in Electronic Grade Reagents by Differential Pulse Polarography
5. Determination of trace and platinum-group elements in high ionic-strength volcanic fluids by sector-field inductively coupled plasma mass spectrometry (ICP-MS)
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