Probing a chemical state during ultra low impact energy secondary ion mass spectrometry depth profiling-Reference-Cited by-同舟云学术

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Probing a chemical state during ultra low impact energy secondary ion mass spectrometry depth profiling

Published:2019 Issue:10 Volume:34 Page:1954-1956
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Michałowski Paweł Piotr¹²³^ORCID

Affiliation:

1. Łukasiewicz Research Network-Institute of Electronic Materials Technology

2. 01-919 Warsaw

3. Poland

Abstract

Ultra low impact energy SIMS allows probing a chemical state and provides qualitative information about strong covalent bonds.

Funder

Narodowe Centrum Nauki

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2019/JA/C9JA00223E

Reference24 articles.

1. Secondary ion mass spectroscopy depth profiling of hydrogen-intercalated graphene on SiC

2. Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)

3. Contamination-free Ge-based graphene as revealed by graphene enhanced secondary ion mass spectrometry (GESIMS)

4. Formation of a highly doped ultra-thin amorphous carbon layer by ion bombardment of graphene

5. Influence of hydrogen intercalation on graphene/Ge(0 0 1)/Si(0 0 1) interface

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2. Insight into structure-property relationship of organometallic terpyridine wires: Combined theoretical and experimental study;Polyhedron;2022-02

3. Electrically active and hydrogen passivated Zn in GaAs/AlGaAs specifically distinguished during secondary ion mass spectrometry depth profiling;Journal of Analytical Atomic Spectrometry;2021

4. Atomic spectrometry update: review of advances in the analysis of metals, chemicals and materials;Journal of Analytical Atomic Spectrometry;2020

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