The control of thin film deposition and recent developments in oxide film growth
Author:
Publisher
Royal Society of Chemistry (RSC)
Subject
Materials Chemistry,General Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2006/JM/B506228D
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4. Characterization of epitaxial thin films by x‐ray diffraction
5. A study of conventional top spin valve structure through the built-up samples technique
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