High-energy proton irradiation damage on two-dimensional hexagonal boron nitride

Author:

Lee Dongryul1234,Yoo Sanghyuk5674ORCID,Bae Jinho1234,Park Hyunik1234,Kang Keonwook5674,Kim Jihyun1234ORCID

Affiliation:

1. Department of Chemical and Biological Engineering

2. Korea University

3. Seoul 02841

4. South Korea

5. Department of Mechanical Engineering

6. Yonsei University

7. Seoul 03722

Abstract

The dielectric layer, which is an essential building block in electronic device circuitry, is subject to intrinsic or induced defects that limit its performance.

Funder

National Research Foundation of Korea

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. 2DMaterials for Space Use;Two‐Dimensional Materials for Nonlinear Optics;2023-09-29

2. In Situ Radiation Hardness Study of Amorphous Zn–In–Sn–O Thin-Film Transistors with Structural Plasticity and Defect Tolerance;ACS Applied Materials & Interfaces;2023-07-05

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