High-resolution diffuse X-ray scattering study from nearly perfect silicon single crystals
Author:
Publisher
International Union of Crystallography (IUCr)
Link
http://journals.iucr.org/a/issues/1979/02/00/a16971/a16971.pdf
Cited by 31 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. IMPORTANT DEVELOPMENTS IN THE FIELDS OF CRYSTAL GROWTH AND REAL STRUCTURE OF NEARLY PERFECT SINGLE CRYSTALS;Journal of Structural Chemistry;2022-07
2. Anodic bonding of silicon onto glass by ion-cut technique and their characterization using high resolution X-ray diffraction studies;Materials Letters;2007-06
3. Study of point defects in as-grown and annealed bismuth germanate single crystals;Journal of Applied Crystallography;2005-05-13
4. MnAs nanoclusters embedded in GaAs studied by x-ray diffuse and coherent scattering;Physical Review B;2003-06-26
5. Study of the influence of oxygen on structural perfection of silicon single crystals by high-resolution X-ray diffraction and infrared absorption measurements;Journal of Applied Crystallography;2000-02-01
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