The geometry of X-ray diffraction from extended-face single crystals-Reference-Cited by-同舟云学术

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The geometry of X-ray diffraction from extended-face single crystals

Published:1981-01-01 Issue:1 Volume:37 Page:105-119
ISSN:0567-7394
Container-title:Acta Crystallographica Section A
language:
Short-container-title:Acta Cryst Sect A

Author:

McIntyre G. J.

Publisher

International Union of Crystallography (IUCr)

Link

http://journals.iucr.org/a/issues/1981/01/00/a19603/a19603.pdf

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of sputter pressure on Ta thin films: Beta phase formation, texture, and stresses;Acta Materialia;2018-05

2. Measuring the linearity of X-ray detectors: consequences for absolute attenuation, scattering and absolute Bragg intensities;Journal of Applied Crystallography;2011-02-22

3. The Anatomy of Bragg Reflections from Small Single Crystals;Crystallography Reviews;1996-08

4. The role of absorption in x‐ray diffraction measurements from epitaxial layers and substrates;Journal of Applied Physics;1990-07-15

5. Absorption effects from surface miscut in reflection diffractometry;Journal of Applied Crystallography;1982-06-01

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