Spectral-brightness optimization of an X-ray free-electron laser by machine-learning-based tuning

Author:

Iwai EitoORCID,Inoue Ichiro,Maesaka HirokazuORCID,Inagaki TakahiroORCID,Yabashi MakinaORCID,Hara Toru,Tanaka HitoshiORCID

Abstract

A machine-learning-based beam optimizer has been implemented to maximize the spectral brightness of the X-ray free-electron laser (XFEL) pulses of SACLA. A new high-resolution single-shot inline spectrometer capable of resolving features of the order of a few electronvolts was employed to measure and evaluate XFEL pulse spectra. Compared with a simple pulse-energy-based optimization, the spectral width was narrowed by half and the spectral brightness was improved by a factor of 1.7. The optimizer significantly contributes to efficient machine tuning and improvement of XFEL performance at SACLA.

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

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