1. Diffraction enhanced x-ray imaging
2. Differential x-ray phase contrast imaging using a shearing interferometer
3. Phase-contrast imaging of weakly absorbing materials using hard X-rays
4. Hall, C. J., Lewis, A. A., Evans, S., Dance, D. R., Arfelli, F., Olivo, A., Rigon, L., Boggis, C. R. M., Ellis, I. O., Evans, A., Pinder, S. E., Jacobs, L., McArthur, P. A., Menk, R. H., Tromba, G. & Rogers, K. D. (2001). ELETTRA Highlights 2000-2001, pp. 12-15. ELETTRA Sincrotron Trieste, Trieste, Italy.
5. High-speed X-ray phase tomography with Talbot interferometer and fringe scanning method