Analysis of refraction and scattering image artefacts in x-ray analyzer-based imaging

Abstract

X-ray analyzer-based imaging (ABI) is a powerful phase-sensitive technique that can provide a wide dynamic range of density and extract useful physical properties of the sample. It derives contrast from x-ray absorption, refraction, and scattering properties of the investigated sample. However, x-ray ABI setups can be susceptible to external vibrations, and mechanical imprecisions of system components, e.g., the precision of motor, which are unavoidable in practical experiments. Those factors will provoke deviations of analyzer angular positions and hence errors in the acquired image data. Consequently, those errors will introduce artefacts in the retrieved refraction and scattering images. These artefacts are disadvantageous for further image interpretation and tomographic reconstruction. For this purpose, this work aims to analyze image artefacts resulting from deviations of analyzer angular positions. Analytical expressions of the refraction and scattering image artefacts are derived theoretically and validated by synchrotron radiation experiments. The results show that for the refraction image, the artefact is independent of the sample’s absorption and scattering signals. By contrast, artefact of the scattering image is dependent on both the sample’s refraction and scattering signals, but not on absorption signal. Furthermore, the effect of deviations of analyzer angular positions on the accuracy of the retrieved images is investigated, which can be of use for optimization of data acquisition. This work offers the possibility to develop advanced multi-contrast image retrieval algorithms that suppress artefacts in the retrieved refraction and scattering images in x-ray analyzer-based imaging.