The COMIX polarimeter: a compact device for XUV polarization analysis

Author:

Pancaldi MatteoORCID,Strüber ChristianORCID,Friedrich Bertram,Pedersoli EmanueleORCID,De Angelis DarioORCID,Nikolov Ivaylo P.ORCID,Manfredda Michele,Foglia Laura,Yulin Sergiy,Spezzani CarloORCID,Sacchi MaurizioORCID,Eisebitt StefanORCID,von Korff Schmising ClemensORCID,Capotondi FlavioORCID

Abstract

We report on the characterization of a novel extreme-ultraviolet polarimeter based on conical mirrors to simultaneously detect all the components of the electric field vector for extreme-ultraviolet radiation in the 45–90 eV energy range. The device has been characterized using a variable polarization source at the Elettra synchrotron, showing good performance in the ability to determine the radiation polarization. Furthermore, as a possible application of the device, Faraday spectroscopy and time-resolved experiments have been performed at the Fe M 2,3-edge on an FeGd ferrimagnetic thin film using the FERMI free-electron laser source. The instrument is shown to be able to detect the small angular variation induced by an optical external stimulus on the polarization state of the light after interaction with magnetic thin film, making the device an appealing tool for magnetization dynamics research.

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Extreme ultraviolet transient gratings;Advances in Physics: X;2023-06-26

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