Abstract
Image registration is broadly used in various scenarios in which similar scenes in different images are to be aligned. However, image registration becomes challenging when the contrasts and backgrounds in the images are vastly different. This work proposes using the total variation of the difference map between two images (TVDM) as a dissimilarity metric in rigid registration. A method based on TVDM minimization is implemented for image rigid registration. The method is tested with both synthesized and real experimental data that have various noise and background conditions. The performance of the proposed method is compared with the results of other rigid registration methods. It is demonstrated that the proposed method is highly accurate and robust and outperforms other methods in all of the tests. The new algorithm provides a robust option for image registrations that are critical to many nano-scale X-ray imaging and microscopy applications.
Funder
US Department of Energy, Office of Science
National Science Foundation, Division of Materials Research
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
Cited by
2 articles.
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