X-ray reflectivity theory for determining the density profile of a liquid under nanometre confinement-Reference-Cited by-同舟云学术

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X-ray reflectivity theory for determining the density profile of a liquid under nanometre confinement

Published:2010-05-19 Issue:4 Volume:17 Page:465-472
ISSN:0909-0495
Container-title:Journal of Synchrotron Radiation
language:
Short-container-title:J Synchrotron Radiat

Author:

Perret Edith,Nygård Kim,Satapathy Dillip K.,Balmer Tobias E.,Bunk Oliver,Heuberger Manfred,van der Veen J. Friso

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Link

http://journals.iucr.org/s/issues/2010/04/00/kv5077/kv5077.pdf

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Recent Progresses in Nanometer Scale Analysis of Buried Layers and Interfaces in Thin Films by X-rays and Neutrons;Analytical Sciences;2020-08-10

2. Structure and Dynamics of Confined Liquids: Challenges and Perspectives for the X-ray Surface Forces Apparatus;Langmuir;2019-10-15

3. Molecular features of hydration layers probed by atomic force microscopy;Physical Chemistry Chemical Physics;2018

4. Adsorption Models for Methane in Shales: Review, Comparison, and Application;Energy & Fuels;2017-09-22

5. Three-Dimensional Structure of a Simple Liquid at a Face-Centered-Cubic (001) Solid Surface Interface;Scientific Reports;2016-07

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