Rapid Mapping of Texture in Polycrystalline Materials Using an Imaging Plate on a Synchrotron Radiation Source
Author:
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
Link
http://journals.iucr.org/s/issues/1995/01/00/he0108/he0108.pdf
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. High energy x-ray diffraction/x-ray fluorescence spectroscopy for high-throughput analysis of composition spread thin films;Review of Scientific Instruments;2009-12
2. Factors Affecting Texture Memory Appearing through α→γ→α Transformation in IF Steels;MATERIALS TRANSACTIONS;2007
3. Applications of Synchrotron-Based X-ray Microprobes;Chemical Reviews;2001-06-01
4. Rapid projection of crystal grain orientation distribution in aluminium alloy sheets by synchrotron X-ray diffraction;Journal of Synchrotron Radiation;1998-05-01
5. Diffraction Imaging of the Grain Structure and Texture of Aluminium Alloys using High Energy Synchrotron X-Rays at the E.S.R.F.;Materials Science Forum;1996-05
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