Rapid projection of crystal grain orientation distribution in aluminium alloy sheets by synchrotron X-ray diffraction
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Published:1998-05-01
Issue:3
Volume:5
Page:1139-1140
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ISSN:0909-0495
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Container-title:Journal of Synchrotron Radiation
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language:
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Short-container-title:J Synchrotron Radiat
Author:
Kawasaki K.,Koizumi M.,Inagaki H.
Abstract
An investigation of the primary recrystallization and the grain growth process of aluminium alloy sheets has been carried out using a method for rapid projection of the crystal grain orientation distribution. It is found that the projected pattern is continuous in the cold-rolled state. When the sheet is annealed, tiny diffraction spots or small grains appear. The addition of Mg greatly alters the sizes and number of grains, and the orientation of the grains in sheets.
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation