Author:
Shreeman P. K.,Matyi R. J.
Abstract
Statistical dynamic diffraction theory (SDDT) provides the ability to model defect-induced structures in high-resolution X-ray diffraction analyses by incorporating both coherent (dynamic) and incoherent (kinematic) scattering. Current treatments of SDDT are mathematically intensive and may not provide sufficient detail regarding the implementation of the theory in practice. This paper discusses the implementation of SDDT and the modifications that allow for successful SDDT analyses of fully relaxed SiGe on Si.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献