UMWEG: a program for the calculation and graphical representation of multiple-diffraction patterns

Abstract

UMWEG, an update of the programUMWEG-98[E. Rossmanith,J. Appl. Cryst.(1999).32, 355–361], makes possible the calculation and graphical representation of multiple-diffraction patterns (Renninger scans, multiple-diffraction peak location plots) and can be applied to X-rays as well as to neutrons. The program is written in Lahey Fortran 95. The program runs without further commercial subroutine libraries. It is distributed for Windows 2000viahttp://www.rrz.uni-hamburg.de/mpi/rossmanith. Executable (binary) files are available free of charge for academic use only.