Grazing incidence small-angle X-ray scattering study of defects in deuterium implanted monocrystalline silicon-Reference-Cited by-同舟云学术

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Grazing incidence small-angle X-ray scattering study of defects in deuterium implanted monocrystalline silicon

Published:2003-04-16 Issue:3 Volume:36 Page:447-449
ISSN:0021-8898
Container-title:Journal of Applied Crystallography
language:
Short-container-title:J Appl Cryst

Author:

Dubček P.,Pivac B.,Bernstorff S.,Corni F.,Tonini R.,Ottaviani G.

Publisher

International Union of Crystallography (IUCr)

Subject

General Biochemistry, Genetics and Molecular Biology

Link

http://journals.iucr.org/j/issues/2003/03/01/ks7214/ks7214.pdf

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray Scattering;Surface Science Reports;2009-08

2. Grazing incidence small-angle x-ray scattering from defects induced by helium implantation in silicon;Journal of Applied Physics;2006-06

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