Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry-Reference-Cited by-同舟云学术

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Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry

Published:2010-03-19 Issue:3 Volume:17 Page:299-307
ISSN:0909-0495
Container-title:Journal of Synchrotron Radiation
language:
Short-container-title:J Synchrotron Radiat

Author:

Diaz Ana,Mocuta Cristian,Stangl Julian,Keplinger Mario,Weitkamp Timm,Pfeiffer Franz,David Christian,Metzger Till H.,Bauer Günther

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Link

http://journals.iucr.org/s/issues/2010/03/00/ie5039/ie5039.pdf

Reference32 articles.

1. Keyhole coherent diffractive imaging

2. Performance of a cryogenic silicon monochromator under extreme heat load

3. Fabrication of diffraction gratings for hard X-ray phase contrast imaging

4. Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam

5. X-Ray Photon Correlation Spectroscopy Study of Brownian Motion of Gold Colloids in Glycerol

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