Discerning best practices in XFEL-based biological crystallography – standards for nonstandard experiments

Author:

Gorel Alexander,Schlichting IlmeORCID,Barends Thomas R. M.ORCID

Abstract

Serial femtosecond crystallography (SFX) at X-ray free-electron lasers (XFELs) is a novel tool in structural biology. In contrast to conventional crystallography, SFX relies on merging partial intensities acquired with X-ray beams of often randomly fluctuating properties from a very large number of still diffraction images of generally randomly oriented microcrystals. For this reason, and possibly due to limitations of the still evolving data-analysis programs, XFEL-derived SFX data are typically of a lower quality than `standard' crystallographic data. In contrast with this, the studies performed at XFELs often aim to investigate issues that require precise high-resolution data, for example to determine structures of intermediates at low occupancy, which often display very small conformational changes. This is a potentially dangerous combination and underscores the need for a critical evaluation of procedures including data-quality standards in XFEL-based structural biology. Here, such concerns are addressed.

Funder

Max-Planck-Gesellschaft

Publisher

International Union of Crystallography (IUCr)

Subject

Condensed Matter Physics,General Materials Science,Biochemistry,General Chemistry

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