Systematic errors in precision lattice-parameter determination of single crystals caused by asymmetric line profiles
Author:
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Link
http://journals.iucr.org/j/issues/1986/01/00/a26308/a26308.pdf
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Precise determination of crystal lattice parameters;Physics-Uspekhi;2020-09-01
2. Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction;Journal of Applied Crystallography;2017-05-25
3. Coincidental multiple x-ray diffraction as tool for precise investigation of crystals;SPIE Proceedings;2008-05-12
4. Simulation of X-Ray Reflection Curves in Single Non-Coplanar Geometry and Its Application;Crystal Research and Technology;2002-07
5. Investigation of the composition of vapour-grown Pb1-xSnxSe crystals ( x ≤ 0.4) by means of lattice parameter measurements;Journal of Crystal Growth;1994-05
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