The layer silicate Cs2SnIVSi6O15

Abstract

Single crystals of Cs2SnSi6O15, dicaesium tin(IV) hexasilicate, were serendipitously obtained from a CsCl/NaCl flux at 923 K, starting from mixtures of CaO, SnO and TeO2 in a closed silica ampoule. The crystal structure of Cs2SnSi6O15 is constructed from {Si6O15}6– layers extending parallel to (101), and CsI cations with a coordination number of eleven as well as isolated [SnO6] octahedra situated between the silicate layers. Each of the nine different SiO4 tetrahedra in the silicate layer has a connectedness of Q 3 (three bridging and one terminal O atom), which leads to the formation of five- and eight-membered rings. The same type of silicate layer is found in the crystal structure of the mineral zeravshanite. Comparison with other silicates of the type Cs2 M IVSi6O15 (M IV = Ti, Zr, Th, U) revealed a klassengleiche group–subgroup relationship of index 2 between Cs2ZrSi6O15 (Z = 6, space group C2/m) and Cs2SnSi6O15 (Z = 12, space group I2/c).