Very High Precision X-ray Diffraction-Reference-Cited by-同舟云学术

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Very High Precision X-ray Diffraction

Published:1966-05 Issue:5037 Volume:210 Page:720-721
ISSN:0028-0836
Container-title:Nature
language:en
Short-container-title:Nature

Author:

BAKER T. W.,GEORGE J. D.,BELLAMY B. A.,CAUSER R.

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/210720a0.pdf

Reference2 articles.

1. Bond, W. L., Acta Cryst., 13, 814 (1960).

2. Bragg, W. H., and Bragg, W. L., X-rays and Crystal Structure (G. Bell and Sons, London); 1915 ed., 29 and 30; 1925 ed., 23.

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Precise determination of crystal lattice parameters;Physics-Uspekhi;2020-09-01

2. Absolute measurement of lattice parameter in single crystals and epitaxic layers on a double-crystal X-ray diffractometer;Acta Crystallographica Section A Foundations of Crystallography;2005-04-21

3. A `beam-selection' high-resolution X-ray diffractometer;Journal of Applied Crystallography;2004-07-17

4. Absolute lattice parameter measurement;Journal of Materials Science: Materials in Electronics;1999

5. A high-resolution multiple-crystal multiple-reflection diffractometer;Journal of Applied Crystallography;1989-02-01

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