Author:
Qian Danna,Ma Cheng,More Karren L,Meng Ying Shirley,Chi Miaofang
Publisher
Springer Science and Business Media LLC
Subject
Condensed Matter Physics,General Materials Science,Modelling and Simulation,Condensed Matter Physics,General Materials Science,Modelling and Simulation
Reference70 articles.
1. Erni, R., Lazar, S. & Browning, N. D. Prospects for analyzing the electronic properties in nanoscale systems by VEELS. Ultramicroscopy 108, 270–276 (2008).
2. Haider, M., Hartel, P., Muller, H., Uhlemann, S. & Zach, J. Current and future aberration correctors for the improvement of resolution in electron microscopy. Philos. Trans. A Math. Phys. Eng. Sci. 367, 3665–3682 (2009).
3. Kirkland, E. J. On the optimum probe in aberration corrected ADF-STEM. Ultramicroscopy 111, 1523–1530 (2011).
4. Lupini, A. R., Krivanek, O. L., Dellby, N., Nellist, P. D. & Pennycook, S. J. Developments in Cs-corrected STEM. Inst. Phys. Conf. Ser No. 168 31–34 (2001).
5. Peng, Y. P., Nellist, P. D. & Pennycook, S. J. HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis. J. Electron Microsc. (Tokyo) 53, 257–266 (2004).
Cited by
80 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献